Volume : IV, Issue : VI, June - 2014

Effect of Terminal Heat Stress on Yield and Yield Attributes of Wheat

Bavita Asthir, Shashi Bala, Navtej Singh Bains

Abstract :

High temperature is a major determinant of wheat development and growth and causes yield loss in many regions of the world. This study was conducted to assess heat stress effects on yield and yield related traits of wheat. Three wheat genotypes C 273 (heat tolerant) and PBW 343, PBW 550 (susceptible) under normal and heat stress (late sowing) conditions. Grain yield, no of grain per kerenel, plant height, grain filling duration, peduncle length, peduncle weight and 1000 kernels weight were measured. High temperature significantly decreased all traits specially grain yield (26% and 54.2%), 1000–kernel weight (24% and 31%) and grain filling duration (3% and 9%) in tolerant and susceptible genotypes, respectively. Grain yield (54%) was most affected and grain filling duration (9%) was least affected by heat stress. These traits could be used as reliable screening tools for development of heat–tolerant genotypes.

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Article: Download PDF   DOI : 10.36106/ijar  

Cite This Article:

Bavita Asthir, Shashi Bala, Navtej Singh Bains Effect of Terminal Heat Stress on Yield and Yield Attributes of Wheat Indian Journal of Applied Research, Vol.IV, Issue.VI June 2014

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