Volume : V, Issue : IX, September - 2016

Annealing effect on structural and electrical properties of CuInTe2 thin films

Y. D. Tembhurkar

Abstract :

 CuInTe2 thin films of thickness 0.186 nm were prepared by spray pyrolysis using aqueous solution of Cupric chloride, Indium tri–chloride and Tellurium tetra–chloride of 0.02M. XRD pattern shows the films is polycrystalline with preferred orientation along 112 direction. Annealing effect shows the atom are arrange regularly. As the films are not doped intentionally defect observed in intrinsic nature operative to be produced by tellurium interstitials. Grain size has been studied by Scanning Electron Microscope.

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Article: Download PDF   DOI : 10.36106/ijsr  

Cite This Article:

Y. D. Tembhurkar Annealing effect on structural and electrical properties of CuInTe2 thin films International Journal of Scientific Research,Volume : 5 | Issue : 9 |September 2016

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