Dispersion Parameters of Thin Cadmium  Telluride Films at Different Thicknesses

Rasha A. Abdullah; Nada M. Saeed; Hussain Kh. Al Khalid; Mohammed A. Razooqi

Volume : II, Issue : III, March - 2013

Dispersion Parameters of Thin Cadmium Telluride Films at Different Thicknesses

Rasha A. Abdullah, Nada M. Saeed, Hussain Kh. Al Khalid, Mohammed A. Razooqi

Abstract :

Thin CdTe films have been prepared by thermal evaporation technique on glass substrate under vacuum of about 10–5mbar. The thicknesses of the films were 2000 and 4000 � 50�. Absorbance spectra of the films indicate that the films have high transparency. The optical studies reveal that the transition is direct with band gap value increased from 1.51eV to 1.56eV with increasing film thicknesses. The refractive index dispersion curves obey to the single oscillator‘s model. The dispersion energy and single–oscillator energy varied with film thicknesses. The moments of optical spectra have studied. The infinite refractive index decreased from 2.41 to 2.05 with increasing film thicknesses.