Volume : II, Issue : XI, November - 2013
Logic Test of Single Cycle Access Structure
S. Ali Ahmed, Syed Jahangir Badashah, A. Farooq Hussain
Abstract :
This work proposes a new single cycle access structure for logic test. It not only eliminates the high power consumption and reduces the activity during shift and capture cycles. This leads to realistic circuit behavior during at–speed tests and stuck–at. This enables the complete test to run at higher frequencies equal or close to the functional mode. It shows that a lesser number of test cycles can be achieved by compared to other published solutions. The test cycles on a simple test pattern generator algorithm without test pattern compression is below 1 for larger designs and is independent of the design size. The structure allows additional on–chip debugging signal visibility for each register. The method is backward compatible to full scan designs and existing test pattern generators and simulators can be used with a minor enhancement. It is shown how to combine the proposed solution with built–in self test and massive parallel scan chains
Keywords :
Article:
Download PDF
DOI : 10.36106/ijsr
Cite This Article:
S. Ali Ahmed, Syed Jahangir Badashah, A. Farooq Hussain / Logic Test of Single Cycle Access Structure / International Journal of Scientific Research, Vol.2, Issue.11 November 2013
Number of Downloads : 849
References :
S. Ali Ahmed, Syed Jahangir Badashah, A. Farooq Hussain / Logic Test of Single Cycle Access Structure / International Journal of Scientific Research, Vol.2, Issue.11 November 2013
Our Other Journals...
-
Indian Journal of
Applied Research Visit Website -
PARIPEX Indian Journal
of Research Visit Website -
Global Journal for
Research Analysis Visit Website