Volume : III, Issue : III, March - 2014

XPS,EDAX and FT–IR Analysis of Annealed Electron Beam Evaporated Cdse Thin Films

Rani. S, Shanthi. J

Abstract :

 Cadmium selenide (cdse) thin films on glass substrates were prepared by electron beam evaporation technique at various substrate temperatures and annealed at room temperature (RT), 100, 200 and 300 o C respectively. Elemental and compositional analysis were accomplished using, Energy dispersive analysis of X–ray (EDAX), and X–ray photoelectron spectroscopy (XPS) .The CdSe films were characterized by Fourier transform infrared spectroscopy (FTIR).

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Article: Download PDF   DOI : 10.36106/ijsr  

Cite This Article:

Rani.S, Shanthi.J XPS,EDAX and FT-IR Analysis of Annealed Electron Beam Evaporated Cdse Thin Films International Journal of Scientific Research, Vol.III, Issue.III March 2014

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