Volume : V, Issue : V, May - 2015

Growth, characterizations and highpressure studies of niobium sulphide single crystals

M. S. Dave, K. R. Patel, R. D. Vaidya

Abstract :

 Single crystals of niobium sulphide (NbS2) having a layered structure were grown by chemical vapour  transport technique (CVT) using iodine as transporting agent. The chemical composition of as grown crystals have been confirmed on the basis of energy dispersive analysis by X–ray. The structural analysis of as grown crystals have been accomplished by X–ray diffraction (XRD) analysis. The lattice parameters obtained from the XRD analysis were a = 3.33 Å & c =17.86 Å. The X–ray density was found to be 3.03 gm/cc and volume was calculated about  171.8 Å3.This crystal is found to possess hexagonal, layered structure. The resistivity measurements of the grown crystals were carried out within the temperature range of temperature 300 K to 423 K. The crystals were found to exhibit  semiconducting nature in this temperature range. The behavior of the resistance under pressure is thoroughly studied  using Bridgman anvil set–up upto 8 GPa. The nature of resistance found to be decreases with increasing pressure which  indicate also semiconducting nature.

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Article: Download PDF   DOI : 10.36106/ijar  

Cite This Article:

M. S. Dave, K. R. Patel, R. D. Vaidya Growth, characterizations and highpressure studies of niobium sulphide single crystals Indian Journal of Applied Research, Vol.5, Issue : 5 May 2015

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