Volume : III, Issue : II, February - 2013

Study of Annealing– induced changes in Structural and Electrical Properties of CdS and CdS:Al Thin Films

Iqbal. S. Naji

Abstract :

Cadmium sulfide and Aluminum doped CdS thin films have been deposited by thermal evaporation in vacuum on glass slide at substrate temperature (Ts) equals to373 K. Films were annealed in air at different temperatures to estimate the effect of the annealing on the structural and electrical properties of the films. XRD investigations revealed that the CdS alloy and their films are polycrystalline nature and have the hexagonal structures with preferred orientation along (002) plane, and appeared one peak belong to cubic structure for thin films. The increase in annealing temperature led to an increases in the intensity of (002) peak. The result of the electrical properties showed that these films were n–type. The conductivity and the carrier concentration of the undoped and Al doped films were increased when the films annealed at different temperature.

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Article: Download PDF   DOI : 10.36106/ijar  

Cite This Article:

Iqbal.S.Naji Study of Annealing- induced changes in Structural and Electrical Properties of CdS and CdS:Al Thin Films Indian Journal of Applied Research, Vol.III, Issue.II February 2013

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